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Class Count: 3
Class Numbers:9; 37; 42

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Class Count: 0
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Class Count: 3
Class Numbers: 9; 37; 42

Event description
Class Number: 9

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Class Number: 9
Class Items: Scientific, measuring and detecting apparatus and instruments; scientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray fluorescence analysers and spectrometers; X-ray fluorescence (XRF) analysers and spectrometers; X-ray detecting apparatus and instruments; X-ray detectors; X-ray detectors not for medical purposes; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; spectrometers; spectrophotometers; spectrometry apparatus; X-ray spectroscopy apparatus [other than for medical use]; elemental analysers; X-ray analysers; X-ray neutron activation analysers; X-ray pulsed fast and thermal neutron activation analysers; ICP (inductively coupled plasma) spectroscopy apparatus and instruments; X-ray analytical apparatus; X-ray apparatus not for medical use; diffraction apparatus [microscopy]; diffraction apparatus for microscopy; diffraction apparatus and instruments; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray fluorescence diffractometers; X-ray diffractometers and wafer analysers; wafer analysers; X-ray imaging detectors; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; X-ray measuring, detecting and monitoring instruments, indicators and controllers; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, including X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus, including scientific and measuring apparatus and instruments, including spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; photon counting X-ray detectors; X-ray tubes, not for medical purposes; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; metrology tools, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; computer software; computer software for analysis purposes; computer software for use in relation to spectrometry; downloadable or recorded computer software for use in relation to spectrometry; computer software for analysis purposes; downloadable or recorded computer software for analysis purposes; computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to diffractometry; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus not for medical use; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; computer software for use in relation to the determination of the thickness of layer samples; downloadable or recorded computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; downloadable or recorded computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; downloadable or recorded computer software for use in relation to the standardless analysis of samples; parts and fittings for all the aforesaid goods; component parts and fittings for all the aforesaid goods.

Event description
Class Number: 42

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Class Number: 42
Class Items: Scientific and technological services and research and design relating thereto; scientific services and design relating thereto; design and development of scientific and measuring apparatus and instruments; industrial analysis and industrial research services; scientific analysis; analysis of materials; laboratory services for analytical testing; elemental analysis; technological services in the field of spectrometry and diffractometry; technological services relating to ICP (inductively coupled plasma) spectroscopy; industrial analysis and research services in the field of spectrometry, diffractometry and ICP (inductively coupled plasma) spectroscopy; design and development of X-ray apparatus, X-ray fluorescence (XRF) analysers and spectrometers, X-ray analytical apparatus, analytical apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, ICP (inductively coupled plasma) spectroscopy apparatus and instruments; design and development of computer hardware and software; design, development and programming of computer software; design, development and programming of computer software in the field of spectrometry, diffractometry and ICP (inductively coupled plasma) spectroscopy; leasing and rental of scientific and measuring apparatus and instruments; leasing and rental of scientific and measuring apparatus, namely X-ray fluorescence (XRF) analysers and spectrometers, elemental spectrometry apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; technological consultancy services and telecommunications technology consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, X-ray tubes, and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; technological consultancy services and telecommunications technology consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray fluorescence (XRF) analysers and spectrometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, and ICP (inductively coupled plasma) spectroscopy apparatus and instruments.

Event description
Class Number: 37

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Class Number: 37
Class Items: Installation, maintenance and repair of scientific and measuring apparatus and instruments; installation, maintenance and repair of X-ray fluorescence (XRF) analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; installation of scientific and measuring apparatus and instruments; installation of X-ray fluorescence (XRF) analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; information, advisory and consultancy services all relating to the aforesaid.